School personnel information

写真b

ABE Masayuki


Keyword

scanning probe microscopy, electromagnetic noise, atom technology, entrepreneurship education

Mail Address

Mail Address

URL

http://abemasayuki.jimdo.com/

Organization 【 display / non-display

  • 2003.04.01 - 2005.03.31, Graduate School of Engineering, Associate Professor

  • 2005.04.01 - 2007.03.31, Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Associate Professor

  • 2007.04.01 - 2008.03.31, Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Associate Professor

  • 2008.04.01 - 2012.01.31, Science and Technology Center for Atoms,Molecules and Ions Control, Graduate School of Engineering, Associate Professor

  • 2012.02.01 - 2012.03.31, Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Associate Professor

  • 2014.03.16 - 2014.03.31, Center for Quantum Science and Technology under Extreme Conditions, Professor

  • 2014.04.01 - , Center for Science and Technology under Extreme Conditions, Graduate School of Engineering Science, Professor

  • 2017.05.01 - , Office for Industry-University Co-Creation

  • 2014.07.01 - , Institute for NanoScience Design

Education 【 display / non-display

Hiroshima University Faculty of Education  Graduated Bachelor of Education 1994.03
Hiroshima University Graduate School, Division of Natural Science  Completed Master of Science 1996.03
Osaka University Graduate School, Division of Engineering  Completed Doctor of Engineering 1999.03

Employment Record 【 display / non-display

JST-PRESTO 2005.10 - 2009.03
Osaka Universsity, Associate Professor 2007.04 - 2012.03
Associate Professor at Nagoya University 2012.04 - 2014.03
Professor at Osaka Unviersity 2014.03 -

Research topics 【 display / non-display

  • Nano/micro-systems-related, Nanostructural physics-related, Nanomaterials-related, Measurement engineering-related, Thin film/surface and interfacial physical properties-related

  • Applied condensed matter physics-related, Computational science-related, Power engineering-related

  • Nanobioscience-related, Thin film/surface and interfacial physical properties-related, Measurement engineering-related

 

Academic Papers 【 display / non-display

  • Theoretical Study of Lumped Parameter Circuits and Multiconductor Transmission Lines for Time-Domain Analysis of Electromagnetic Noise, M. abe and H. Toki, Scientific Reports,9, 118, 2019.01, Papers

  • High-resolution imaging of LaAlO3 (100)-(1x4) reconstructed surface using non-contact atomic force microscopy, D. Katsube and M. Abe, Appl. Phys. Lett., 2018.07, Papers

  • Bifacial nucleobases for hexaplex formation in aqueous solution, 5. H. Kashida, Y. Hattori, K. Tazoe, T. Inoue, K. Nishikawa, K. Ishii, S. Uchiyama, , H. Yamashita, M. Abe, Y. Kamiya, H. Asanuma, J. Am. Chem. Soc.,Vol.4, pp.8456-8462 (2018), 2018.07, Papers

  • Facile Synthesis Route of Au-Ag Nanostructures Soaked in PEG, E. K. Fodjo, A. Canlier, C. Kong, A. Yurtsever, P. L. A. Guillaume, F. T. Patrice, M. Abe, T. Tohei, A. Sakai, Advances in Nanoparticles, 2018.07, Papers

  • Control of surface potential and hydroxyapatite formation on TiO2 scales containing nitrogen-related defects, 3. Masami Hashimoto, Takafumi Ogawa, Satoshi Kitaoka, Shunsuke Muto, Maiko Furuya, Hiroyasu Kanetaka, Masayuki Abe, Hayato Yamashita, 2018.06, Papers

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Books 【 display / non-display

  • Special, Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy, Advances in Atom and Single Molecule Machines, Y. Sugimoto, M. Abe, and S. Morita, Springer, ISBN, 3319174002, 2015.04

  • Special, Noncontact Atomic Force Microscopy vol.3, Masayuki. Abe, Yoshiaki Sugimoto and Seizo Morita, Springer, ISBN, 3319155873, 2015.03

  • Special, Scanning Probe Microsocopy: Chracterization, Nanofabrication and Device Application of Functional Materials, Part III Application of Scanning Techniques to Functional Materials "Microscale Contact Charging on a Silicon Oxide", S. Morita, T. Uchihashi, K. Okamoto, M. Abe and Y. Sugawara, Kluwer Academic Publishers, 2004.12

  • Special, Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, S. Morita, T. Uchihashi, K. Okamoto, M. Abe, and Y. Sugawara, NATO, 2000.10

Patents / Utility models / Designs 【 display / non-display

  •  , unknown, Masayuki Abe, 1200200583(Registration), 2002.08

  •  , unknown, Masayuki Abe, 200204974-0(Registration), 2002.08

  • United States, Magnetic head measuring apparatus and measuring method applied to the same apparatus, M. Abe, 10062571(Registration), 2002.02

  • United States, Device and method for measuring the properties of a magnetic reproducing head, M. Abe, 9835547(Registration), 2001.04

  • United States, Method and apparatus for measuring characteristic of specimen and its application to high frequency response measurement with scanning probe microscopes, M. Abe, 9811771(Registration), 2001.03

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