School personnel information

写真b

NAKAMAE Kouji


Keyword

Integrated Systems Engineering

URL

http://www-ise3.ise.eng.osaka-u.ac.jp/member/nakamae.html

Organization 【 display / non-display

  • 1998.04.01 - 2002.03.31, Graduate School of Engineering, Associate Professor

  • 2002.04.01 - 2005.12.31, Department of Information Systems Engineering, Graduate School of Information Science and Technology, Associate Professor

  • 2006.01.01 - 2019.03.31, Department of Information Systems Engineering, Graduate School of Information Science and Technology, Professor

  • 2019.04.01 - , Department of Information Systems Engineering, Graduate School of Information Science and Technology, Specially Appointed Professor

Education 【 display / non-display

Osaka University Faculty of Engineering  Graduated 1977.03
Osaka University Graduate School, Division of Engineering  Completed 1979.03
Osaka University Graduate School, Division of Engineering  Completed 1982.03

Employment Record 【 display / non-display

Osaka University, Professor 2006.01 -

Academic Society Membership 【 display / non-display

  • IEEE

  • Reliability Engineering Association of Japan

  • SPIE

  • Japan Society for Equilibrium Research

  • The Institute of Nano testing

 

Academic Papers 【 display / non-display

  • Temporally- and Spatially- Resolved Observations of Current Filament Dynamics in Insulated Gate Bipolar Transistor Chip during Avalanche Breakdown, Koichi Endo, Koji Nakamae, IEEE Transactions on Device and Materials Reliability, 2019.11, Papers

  • A quantum watermarking scheme using simple and small-scale quantum circuits, S. Miyake, K. Nakamae,Quantum Inf Process, 2016.05, Papers

  • Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements, M. Koguchi, R. Tsuneta, Y. Anan, and K. Nakamae, Measurement Science and Technology,vol. 28, pp. 015904-1-9, 2016, 2016.12, Papers

  • A robust SEM auto-focus algorithm using multiple band-pass filters, M. Harada, K. Obara, and K. Nakamae, Measurement Science and Technology,vol. 28, pp. 015403-1-10, 2016, 2016.12, Papers

  • The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization, Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae, Microelectronics Reliability,vol. 51, no. 9-11, pp. 1624–1631, 2011.10, http://pdn.sciencedirect.com/science?_ob=MiamiImageURL&_cid=271470&_user=9152734&_pii=S0026271411002599&_check=y&_origin=browse&_zone=rslt_list_item&_coverDate=2011-11-30&wchp=dGLzVBA-zSkWb&md5=78d34811ec6d2cc6b52fdd9ddf73d5ac/1-s2.0-S0026271411002599-main, International Conference(Proceedings)

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Books 【 display / non-display

  • Other, LSI testing handbook, Koji Nakamae, Others, Ohmsha, ISBN, 978-4-274-20632-0, 2008.11

 

Outside Activity Management 【 display / non-display

  • Academic society, The Institute of NANO Testing, Chair, 2006.06 -