School personnel information

写真b

Organization 【 display / non-display

  • 1998.04.01 - 2003.03.31, Graduate School of Engineering, Research Assistant

  • 2003.04.01 - 2007.03.31, Science and Technology Center for Atoms,Molecules and Ions Control, Graduate School of Engineering, Research Assistant

  • 2007.04.01 - , Research Center for Ultra-High Voltage Electron Microscopy, Associate Professor

Education 【 display / non-display

Osaka University Faculty of Engineering  Graduated 1990.03
Osaka University Graduate School, Division of Engineering  Completed 1992.03

Research topics 【 display / non-display

  • Measurement engineering-related

  • Measurement engineering-related

  • Measurement engineering-related

 

Academic Papers 【 display / non-display

  • Spherical aberration correction with in-lens N-fold symmetric line currents, S. Hoque, R. Nishi, H. Ito, and A.Takaoka,Tenth International Conference on Charged Particle Optics, 2018.10, International Conference(Non Proceeding)

  • Investigation of electromagnetic-SYLC for chromatic aberration correction, R. Nishi, S. Hoque, H. Ito, and A.Takaoka,Tenth International Conference on Charged Particle Optics, 2018.10, International Conference(Non Proceeding)

  • Spherical aberration correction with an in-lens N-fold symmetric line currents model, Shahedul Hoque, Hiroyuki Ito, Ryuji Nishi, Ultramicroscopy,vol. 187, pp. 135-143, 2018.04, Papers

  • Axial geometrical aberration correction up to 5th order with N-SYLC, Shahedul Hoque, Hiroyuki Ito, Akio Takaoka, Ryuji Nishi, Ultramicroscopy,182 68-80, 2017.11, Papers

  • Automatic system for electron tomography data collection in the ultra-high voltage electron microscope, Meng Cao, Ryuji Nishi, Fang Wang, Micron,Vol. 33, pp. 29-33, 2017.09, Papers

display all >>

Books 【 display / non-display

  • Special, Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Part II Fundamentals of Scanning Probe Techniques "Functions of NC-AFM on Atomic Scale", S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi and Y. Sugawara, Kluwer Academic Publishers, 2004.12

  • Special, FUNCTIONS OF NC-AFM ON ATOMIC SCALE, Seizo Morita, Noriaki Oyabu, Takahiro Nishimoto, Ryuji Nishi, Oscar Custance, Insook Yi and Yasuhiro Sugawara, NATO Advanced Study Institute, 2000.10