School personnel information

写真b

SUGAWARA Yasuhiro


Keyword

Atomic Force Microscopy, Scanning Probe Microscopy, Surface Science, Nanotechnology

Mail Address

Mail Address

URL

http://nanophysics.ap.eng.osaka-u.ac.jp/

Gender

Male

Organization 【 display / non-display

  • 1998.04.01 - 2002.04.30, Graduate School of Engineering, Associate Professor

  • 2002.05.01 - 2005.03.31, Graduate School of Engineering, Professor

  • 2005.04.01 - , Division of Precision Science & Technology and Applied Physics, Graduate School of Engineering, Professor

Education 【 display / non-display

Tohoku University Graduate School, Division of Engineering  Completed 1987.03

Research topics 【 display / non-display

  • Nanometer-scale chemistry-related

  • Nanometer-scale chemistry-related

 

Academic Papers 【 display / non-display

  • Subatomic-scale resolution with SPM: Co adatom on p(2 x 1)Cu(110):O, Robert Turansky, Krisztian Palotas, Jan Brndiar, Yanjun Li, Yasuhiro Sugawara, Ivan Stich , Nanotechnology,30 095703(1)-095703(7), 2019.01, Papers

  • Direct observation of atomic step edges on the rutile TiO2(110)-(1× 1) surface using atomic force microscopy, Huan Fei Wen, Masato Miyazaki, Quanzhen Zhang, Yuuki Adachi, Yan Jun Li, and Yasuhiro Sugawara, Phys. Chem. Chem. Phys.,20 28337-28337, 2018.11, Papers

  • Measurement and Manipulation of the Charge State of Adsorbed Oxygen Adatom on Rutile TiO2(110)-1×1 Surface by nc-AFM and KPFM, Quanzhen Zhang, Yan Jun Li, Huan Fei Wen, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng, Ján Brndiar, Lev Kantorovich, and Ivan Štich, Journal of American Chemical Society,140(46) 15668-15674, 2018.10, Papers

  • Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy, Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara, Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy,122 17395-17399, 2018.07, Papers

  • Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM, Yanjun Li, Huanfei Wen, Q. Zhang, Y. Adachi, Eiji Arima, Yukinori Kinoshita, Hikaru Nomura, Zongmin Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara, Rui Xu, Zhihai Cheng, Ultramicroscopy,191 51-55, 2018.04, Papers

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Books 【 display / non-display

  • Special, Next Generation Actuators Leading Breakthroughs, Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima, Springer, 2010.01

  • Special, "Roadmap of Scanning Probe Microscopy" 3.Atomic Force Microscopy(AFM), Y.Sugawara, Springer, 2006.08

  • Special, "Noncontact Atomic Force Microscopy"Applied Scanning Probe Methods VI Characterization, Y.Sugawara, Springer, 2006.07

  • Special, Analysis of Organic and Biological Molecules, in Scanning Probe Spectroscopy for Nanoscale Science and Technology, ed. By H. Shigekawa, M. Yoshimura, M Sakata, A. Kawazu (Shokabo, Tokyo 2005), Takuya Matsumtoo, Tomoji Kawai H. Shigekawa, M. Yoshimura, M Sakata, A. Kawazu, Shokabo, Tokyo, 2005.11

  • Special, Scanning Probe Microsocopy: Chracterization, Nanofabrication and Device Application of Functional Materials, Part III Application of Scanning Techniques to Functional Materials "Microscale Contact Charging on a Silicon Oxide", S. Morita, T. Uchihashi, K. Okamoto, M. Abe and Y. Sugawara, Kluwer Academic Publishers, 2004.12

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