School personnel information

写真b

SUGAWARA Yasuhiro


Keyword

Atomic Force Microscopy, Scanning Probe Microscopy, Surface Science, Nanotechnology

Mail Address

Mail Address

URL

http://nanophysics.ap.eng.osaka-u.ac.jp/

Gender

Male

Organization 【 display / non-display

  • 1998.04.01 - 2002.04.30, Graduate School of Engineering, Associate Professor

  • 2002.05.01 - 2005.03.31, Graduate School of Engineering, Professor

  • 2005.04.01 - , Division of Precision Science & Technology and Applied Physics, Graduate School of Engineering, Professor

Education 【 display / non-display

Tohoku University Graduate School, Division of Engineering  Completed 1987.03

Research topics 【 display / non-display

  • Nanometer-scale chemistry-related

  • Nanometer-scale chemistry-related

 

Academic Papers 【 display / non-display

  • KPFM/AFM imaging on TiO2(110) surface in O2 gas, Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yanjun Li, and Yasuhiro Sugawara, Nanotechnology,29 105504(1)-105504(8), 2018.02, Papers

  • Sub-atomic-scale tip-surface force vector mapping above a Ge(001) dimer using bimodal atomic force micorscopy, Yoshitaka Naitoh, Robert Turanský, Ján Brndiar, Yan Jun Li, Ivan Štich and Yasuhiro Sugawara, nature physics,13(7) 663-667, 2017.04, Papers

  • Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy, Lili Kou, Yan Jun Li, Takeshi Kamijo, Yoshitaka Naitoh, and Yasuhiro Sugawara, Nanotechnology,27, 505704(1-7), 2016.11, Papers

  • Promoting atoms into delocalized long-living magnetically modified state using Atomic Force Microscopy, Y. Kinoshita, R. Turanský, J. Brndiar, Y. Naitoh, Y. J. Li, L. Kantorovich, Y. Sugawara and I. Štich, Nano Letters,16(12) 7490-7494, 2016.10, Papers

  • Development of Low Temperature Atomic Force Microscopy with an Optical Beam Deflection System Capable of Simultaneously Detecting the Lateral and Vertical Forces, Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara, Rev. Sci. Instrum.,87, 093113(1-6), 2016.09, Papers

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Books 【 display / non-display

  • Special, Next Generation Actuators Leading Breakthroughs, Y. Sugawara, Y. J. Li, Y. Naitoh and M. Kageshima, Springer, 2010.01

  • Special, "Roadmap of Scanning Probe Microscopy" 3.Atomic Force Microscopy(AFM), Y.Sugawara, Springer, 2006.08

  • Special, "Noncontact Atomic Force Microscopy"Applied Scanning Probe Methods VI Characterization, Y.Sugawara, Springer, 2006.07

  • Special, Analysis of Organic and Biological Molecules, in Scanning Probe Spectroscopy for Nanoscale Science and Technology, ed. By H. Shigekawa, M. Yoshimura, M Sakata, A. Kawazu (Shokabo, Tokyo 2005), Takuya Matsumtoo, Tomoji Kawai H. Shigekawa, M. Yoshimura, M Sakata, A. Kawazu, Shokabo, Tokyo, 2005.11

  • Special, Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Part II Fundamentals of Scanning Probe Techniques "Functions of NC-AFM on Atomic Scale", S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi and Y. Sugawara, Kluwer Academic Publishers, 2004.12

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