School personnel information

写真b

MIURA Katsuyoshi


Keyword

Integrated Systems Diagnosis

Mail Address

Mail Address

Laboratory Phone number

+81-6-6879-7813

Laboratory Fax number

+81-6-6879-7812

URL

http://www-ise3.ist.osaka-u.ac.jp/

Gender

Male

Organization 【 display / non-display

  • 1998.04.01 - 2002.03.31, Graduate School of Engineering, Research Assistant

  • 2002.04.01 - 2007.01.31, Department of Information Systems Engineering, Graduate School of Information Science and Technology, Research Assistant

  • 2007.02.01 - 2007.03.31, Department of Information Systems Engineering, Graduate School of Information Science and Technology, Associate Professor

  • 2007.04.01 - , Department of Information Systems Engineering, Graduate School of Information Science and Technology, Associate Professor

Education 【 display / non-display

Osaka University Faculty of Engineering Department of Electronic Engineering Graduated Bachelor of Engineering 1992.03
Osaka University Graduate School, Division of Engineering Department of Electronic Engineering Completed Master of Engineering 1994.03
Osaka University Graduate School, Division of Engineering Department of Information Systems Engineering Doctor of Philosophy 1997.10

Employment Record 【 display / non-display

Assistant Proefessor, Osaka University 1994.04 - 2007.01
Associate Professor, Osaka University 2007.02 - 2007.03
Associate Professor, Osaka University 2007.04 -

Research topics 【 display / non-display

  • Research on fault diagnosis of ULSI
    Control and system engineering-related

Academic Society Membership 【 display / non-display

  • IEEE

  • The Institute of NANO Testing

 

Academic Papers 【 display / non-display

  • Line extraction method for SEM metrology by utilizing watershed algorithm and machine learning, K. Miura, Y. Midoh, Y. Toyoda, H. Ushiba, S. Shinoda, and K. Nakamae, Proceedings of the 34th annual NANO Testing Symposium, 189-194, 2014.11, International Conference(Proceedings)

  • THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis, M. Yamashita, O. Otani, T. Matsumoto, Y. Midoh, K. Miura, K. Nakamae, K. Nikawa, S. Kim, M. Murakami, M. Tonouchi, OPTICS EXPRESS,vol. 19, no. 11, pp. 10864-10873, 2011.05, Papers

  • New Approach of Laser-SQUID Microscopy to LSI Failure Analysis, K. Nikawa, S. Inoue, T. Nagaishi, T. Matsumoto, K. Miura and K. Nakamae, IEICE Trans. Electronics,Vol. E92-C, No. 3 pp.327-333, 2009.03, Papers

  • Study on emission analysis assist system by utilizing software failure diagnosis and its related circuit extracted from layout, K. Miura, K. Norimatsu, and K. Nakamae, Proceedings of the 34th annual NANO Testing Symposium, 269-273, 2014.11, Conference Report / Oral Presentation (In Japanese)

  • Enhancement of Defect Tolerance in the QCA-based Programmable Logic Array (PLA), T. Notsu, K. Miura, and K. Nakamae, Nanotech Conference & Expo 2010, Anaheim, CA, USA,pp. 29- 32, 2010.06, http://materiales.azc.uam.mx/area/Ingenieria_Materiales/investigaci%C3%B3n/2261204/cuan%20calif/Cuan%20TechConWo2010/CD/Nanotech2010/pdf/1062.pdf, International Conference(Proceedings)

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Awards 【 display / non-display

  • CADuser ML Best Contributor Award, Katsuyoshi Miura, IEEE SSCS Japan Chapter, 2007.06

 

Conference management 【 display / non-display

  • International Conference, the 38th NANO Testing Symposium (NANOTS 2018), Secretariat, 2018.11

  • International Conference, The 37th NANO Testing Symposium (NANOTS 2017), secretariat, 2017.11

  • International Conference, The 36th NANO Testing Symposium (NANOTS 2016), secretariat, 2016.11

  • National Conference, The 35nd Annual NANO Testing Symposium, Secretariat, 2015.11

  • National Conference, The 34nd Annual NANO Testing Symposium, Secretariat, 2014.11

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Outside Activity Management 【 display / non-display

  • Academic society, The Institute of NANO Testing, Secretariat, 2013.06 -

  • Academic society, The Institute of LSI Testing, Secretariat, 2008.06 - 2013.05